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M2S090T-1FGG484

IC fpga soc 90k luts 484fbga

器件类别:可编程逻辑器件    可编程逻辑   

厂商名称:Microsemi

厂商官网:https://www.microsemi.com

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器件参数
参数名称
属性值
是否Rohs认证
符合
厂商名称
Microsemi
包装说明
BGA, BGA484,22X22,40
Reach Compliance Code
compliant
JESD-30 代码
S-PBGA-B484
JESD-609代码
e1
长度
23 mm
湿度敏感等级
3
输入次数
267
逻辑单元数量
86316
输出次数
267
端子数量
484
最高工作温度
85 °C
最低工作温度
封装主体材料
PLASTIC/EPOXY
封装代码
BGA
封装等效代码
BGA484,22X22,40
封装形状
SQUARE
封装形式
GRID ARRAY
峰值回流温度(摄氏度)
250
电源
1.2 V
可编程逻辑类型
FIELD PROGRAMMABLE GATE ARRAY
认证状态
Not Qualified
座面最大高度
2.44 mm
最大供电电压
1.26 V
最小供电电压
1.14 V
标称供电电压
1.2 V
表面贴装
YES
技术
CMOS
温度等级
OTHER
端子面层
Tin/Silver/Copper (Sn/Ag/Cu)
端子形式
BALL
端子节距
1 mm
端子位置
BOTTOM
处于峰值回流温度下的最长时间
40
宽度
23 mm
文档预览
DS0128
Datasheet
IGLOO2 FPGA and SmartFusion2 SoC FPGA
Microsemi Corporate Headquarters
One Enterprise, Aliso Viejo,
CA 92656 USA
Within the USA: +1 (800) 713-4113
Outside the USA: +1 (949) 380-6100
Fax: +1 (949) 215-4996
Email:
sales.support@microsemi.com
www.microsemi.com
© 2016 Microsemi Corporation. All
rights reserved. Microsemi and the
Microsemi logo are trademarks of
Microsemi Corporation. All other
trademarks and service marks are the
property of their respective owners.
Microsemi makes no warranty, representation, or guarantee regarding the information contained herein or the suitability of
its products and services for any particular purpose, nor does Microsemi assume any liability whatsoever arising out of the
application or use of any product or circuit. The products sold hereunder and any other products sold by Microsemi have
been subject to limited testing and should not be used in conjunction with mission-critical equipment or applications. Any
performance specifications are believed to be reliable but are not verified, and Buyer must conduct and complete all
performance and other testing of the products, alone and together with, or installed in, any end-products. Buyer shall not
rely on any data and performance specifications or parameters provided by Microsemi. It is the Buyer's responsibility to
independently determine suitability of any products and to test and verify the same. The information provided by Microsemi
hereunder is provided “as is, where is” and with all faults, and the entire risk associated with such information is entirely
with the Buyer. Microsemi does not grant, explicitly or implicitly, to any party any patent rights, licenses, or any other IP
rights, whether with regard to such information itself or anything described by such information. Information provided in this
document is proprietary to Microsemi, and Microsemi reserves the right to make any changes to the information in this
document or to any products and services at any time without notice.
About Microsemi
Microsemi Corporation (Nasdaq: MSCC) offers a comprehensive portfolio of semiconductor and system solutions for
aerospace & defense, communications, data center and industrial markets. Products include high-performance and
radiation-hardened analog mixed-signal integrated circuits, FPGAs, SoCs and ASICs; power management products;
timing and synchronization devices and precise time solutions, setting the world's standard for time; voice processing
devices; RF solutions; discrete components; enterprise storage and communication solutions, security technologies and
scalable anti-tamper products; Ethernet solutions; Power-over-Ethernet ICs and midspans; as well as custom design
capabilities and services. Microsemi is headquartered in Aliso Viejo, California, and has approximately 4,800 employees
globally. Learn more at
www.microsemi.com.
51700128. 11.0 10/16
Contents
1 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
1.10
1.11
Revision 11.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 10.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 9.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 8.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 7.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 6.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 5.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 4.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 3.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 2.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Revision 1.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1
1
1
2
2
2
2
2
3
3
3
2 IGLOO2 FPGA and SmartFusion2 SoC FPGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1
2.2
2.3
Device Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2.3.1
Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2.3.2
Power Consumption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.3.3
Average Fabric Temperature and Voltage Derating Factors . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.3.4
Timing Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3.5
User I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.3.6
Logic Element Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
2.3.7
Global Resource Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
2.3.8
FPGA Fabric SRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
2.3.9
Programming Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
2.3.10 Math Block Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
2.3.11 Embedded NVM (eNVM) Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
2.3.12 SRAM PUF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
2.3.13 Non-Deterministic Random Bit Generator (NRBG) Characteristics . . . . . . . . . . . . . . . . . . . . 106
2.3.14 Cryptographic Block Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
2.3.15 Crystal Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
2.3.16 On-Chip Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
2.3.17 Clock Conditioning Circuits (CCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
2.3.18 JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
2.3.19 System Controller SPI Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113
2.3.20 Power-up to Functional Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114
2.3.21 DEVRST_N Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
2.3.22 DEVRST_N to Functional Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
2.3.23 Flash*Freeze Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
2.3.24 DDR Memory Interface Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
2.3.25 SFP Transceiver Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
2.3.26 SerDes Electrical and Timing AC and DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 121
2.3.27 SmartFusion2 Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
2.3.28 CAN Controller Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
2.3.29 USB Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
2.3.30 MMUART Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
2.3.31 IGLOO2 Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
DS0128 Datasheet Revision 11.0
iii
Figures
Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Figure 9
Figure 10
Figure 11
Figure 12
Figure 13
Figure 14
Figure 15
Figure 16
Figure 17
Figure 18
Figure 19
Figure 20
Figure 21
Figure 22
Figure 23
High Temperature Data Retention (HTR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Timing Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Input Buffer AC Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Output Buffer AC Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Tristate Buffer for Enable Path Test Point . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Timing Model for Input Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
I/O Register Input Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Timing Model for Output/Enable Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
I/O Register Output Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Input DDR Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Input DDR Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Output DDR Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
Output DDR Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
LUT-4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Sequential Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Sequential Module Timing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Power-up to Functional Timing Diagram for SmartFusion2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
Power-up to Functional Timing Diagram for IGLOO2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
DEVRST_N to Functional Timing Diagram for SmartFusion2 . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
DEVRST_N to Functional Timing Diagram for IGLOO2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
I2C Timing Parameter Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
SPI Timing for a Single Frame Transfer in Motorola Mode (SPH = 1) . . . . . . . . . . . . . . . . . . . . . 128
SPI Timing for a Single Frame Transfer in Motorola Mode (SPH = 1) . . . . . . . . . . . . . . . . . . . . . 131
DS0128 Datasheet Revision 11.0
iv
Tables
Table 1
Table 2
Table 3
Table 4
Table 5
Table 6
Table 7
Table 8
Table 9
Table 10
Table 11
Table 12
Table 13
Table 14
Table 15
Table 16
Table 17
Table 18
Table 19
Table 20
Table 21
Table 22
Table 23
Table 24
Table 25
Table 26
Table 27
Table 28
Table 29
Table 30
Table 31
Table 32
Table 33
Table 34
Table 35
Table 36
Table 37
Table 38
Table 39
Table 40
Table 41
Table 42
Table 43
Table 44
Table 45
Table 46
Table 47
Table 48
Table 49
Table 50
IGLOO2 and SmartFusion2 Design Security Densities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
IGLOO2 and SmartFusion2 Data Security Densities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
FPGA Operating Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Embedded Operating Flash Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Device Storage Temperature and Retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
High Temperature Data Retention (HTR) Lifetime . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Package Thermal Resistance of SmartFusion2 and IGLOO2 Devices . . . . . . . . . . . . . . . . . . . . . 10
Quiescent Supply Current Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
SmartFusion2 and IGLOO2 Quiescent Supply Current (V
DD
= 1.2 V) – Typical Process . . . . . . . 12
Currents During Program Cycle, 0 °C < = T
J
<= 85 °C – Typical Process . . . . . . . . . . . . . . . . . . . 13
Currents During Verify Cycle, 0 °C <= T
J
<= 85 °C – Typical Process . . . . . . . . . . . . . . . . . . . . . . 13
SmartFusion2 and IGLOO2 Quiescent Supply Current (V
DD
= 1.26 V) – Worst-Case Process . . 13
Average Junction Temperature and Voltage Derating Factors for Fabric Timing Delays . . . . . . . . 14
Inrush Currents at Power up, –40 °C <= T
J
<= 100 °C – Typical Process . . . . . . . . . . . . . . . . . . . 14
Timing Model Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Maximum Data Rate Summary Table for Single-Ended I/O in Worst-Case Industrial Conditions . 19
Maximum Data Rate Summary Table for Voltage-Referenced I/O in Worst-Case
Industrial Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Maximum Data Rate Summary Table for Differential I/O in Worst-Case Industrial Conditions . . . 20
Maximum Frequency Summary Table for Single-Ended I/O in Worst-Case Industrial Conditions . 20
Maximum Frequency Summary Table for Voltage-Referenced I/O in Worst-Case Industrial
Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Maximum Frequency Summary Table for Differential I/O in Worst-Case Industrial Conditions . . . 21
Input Capacitance, Leakage Current, and Ramp Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
I/O Weak Pull-up/Pull-down Resistances for DDRIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
I/O Weak Pull-Up/Pull-Down Resistances for MSIO I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
I/O Weak Pull-up/Pull-down Resistances for MSIOD I/O Bank . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Schmitt Trigger Input Hysteresis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
LVTTL/LVCMOS 3.3 V DC Recommended DC Operating Conditions (Applicable to MSIO I/O
Bank Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
LVTTL/LVCMOS 3.3 V Input Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . 24
LVCMOS 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . . . 24
LVTTL 3.3 V DC Output Voltage Specification (Applicable to MSIO I/O Bank Only) . . . . . . . . . . . 24
LVTTL/LVCMOS 3.3 V AC Maximum Switching Speed (Applicable to MSIO I/O Bank Only) . . . . 24
LVTTL/LVCMOS 3.3 V Receiver Characteristics for MSIO I/O Bank (Input Buffers) . . . . . . . . . . . 25
LVTTL/LVCMOS 3.3 V Transmitter Characteristics for MSIO I/O Bank (Output and
Tristate Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
LVTTL/LVCMOS 3.3 V AC Test Parameter Specifications (Applicable to MSIO I/O Bank Only) . . 25
LVTTL/LVCMOS 3.3 V Transmitter Drive Strength Specifications for MSIO I/O Bank . . . . . . . . . . 25
LVCMOS 2.5 V DC Recommended DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LVCMOS 2.5 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LVCMOS 2.5 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LVCMOS 2.5 V AC Minimum and Maximum Switching Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LVCMOS 2.5 V AC Calibrated Impedance Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LVCMOS 2.5 V Receiver Characteristics (Input Buffers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
LVCMOS 2.5 V Transmitter Characteristics for DDRIO Bank (Output and Tristate Buffers) . . . . . 27
LVCMOS 2.5 V AC Test Parameter Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
LVCMOS 2.5 V Transmitter Drive Strength Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
LVCMOS 2.5 V Transmitter Characteristics for MSIO Bank (Output and Tristate Buffers) . . . . . . 28
LVCMOS 1.8 V DC Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
LVCMOS 1.8 V DC Input Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
LVCMOS 1.8 V DC Output Voltage Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
DS0128 Datasheet Revision 11.0
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